Systematical Characterization of Material Response to Microscale Laser Shock Peening  

Oleh:

Yao, Y. Lawrence ; Wang, Youneng ; Chen, Hongqiang ; Kysar, Jeffrey W.

Jenis: Article from Journal - ilmiah internasional
Dalam koleksi: Journal of Manufacturing Science and Engineering vol. 126 no. 4 (Nov. 2004), page 740-749.
Topik: microscale; systematical characterization; material response; microscale; laser shock; peening

Ketersediaan

Perpustakaan Pusat (Semanggi) Nomor Panggil: JJ93.6 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada

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Isi artikel

The response of materials after microscale laser shock peening (µLSP) was experimentally characterized and compared with the theoretical prediction from FEM analysis in microlength level. Since µLSP is predominantly a mechanical process instead of a thermal process, the characterization focuses on mechanical properties and associated microstructures. An X -ray microdiffraction techniq ue was applied on the postpeened single crystal aluminum of (001) and (110) orientations, and an X-ray profile was analyzed by subprofiling and Fourier analysis method. Spatially resolved residual stress and strain deviation was quantified and explained in terms of the heterogeneous dislocation cell structure. In-plane crystal lattice rotation induced by µLSP were measured by electron backscatter diffraction (EBSD) and compared with the FEM simulation. Average mosaic size was evaluated from X - ray profile Fourier analysis and compared with the result from EBSD. Surface strength increase and dislocation cell structure formation were studied. The systematical characterization helps develop more realistic simulation models and obtain better understanding in microlength level.

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