Detail Semiconductor Test Strategies   Oleh:  Ochoa, J. A. ; Porter, J. R. Jenis: Article from Bulletin/Magazine Dalam koleksi: IEEE Instrumentation & Measurement Magazine vol. 6 no. 1 (2003), page 20-25. Topik: SEMICONDUCTORS; semiconductor; test; strategies Ketersediaan Perpustakaan Pusat (Semanggi) Nomor Panggil: II47.4 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada     Lihat Detail Induk Isi artikel The test industry is currently looking for innovative solutions to address both the rising cost of testing and the growing influence that testing has on the time - to - market for new devices. These solutions include new tester technologies, new test practices and strategies, and increasing the output, experience level, and motivation of test engineers. With this in mind, this article presents a brief background on semiconductor device testing, an overview of the current issues that test engineers are facing and some of the strategies being used to overcome the rising cost of semiconductor device testing. Opini Anda Klik untuk menuliskan opini Anda tentang koleksi ini! Kembali

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