Film Thickness and Wave Velocity Measurements in A Vertical Duct  

Oleh:

Kumar, Ranganathan ; Gottmann, Matthias ; Sridhar, K. R.

Jenis: Article from Bulletin/Magazine
Dalam koleksi: Journal of Fluids Engineering vol. 124 no. 3 (2002), page 634-642.
Topik: velocity; film thickness; wave; velocity; measurement; vertical duct

Ketersediaan

Perpustakaan Pusat (Semanggi) Nomor Panggil: JJ89.3 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada

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Isi artikel

This paper describes the experimental investigation of an upward annular air - water flow in a duct with a 6.35 mm by 63.5 mm rectangular cross section. The test section was instrumented to measure the film thickness and the interfacial wave velocity. Flush - wire electrical conductivity probes were used to obtain local film thickness measurement with a spatial resolution of 200 µm or better and a temporal resolution greater than 2 kHz. Measurements of the base films range from 50 µm to ~ 325 µm (2 % to 10 % of half - channel thickness). Statistical analysis shows that the standard deviation of the film thickness is a good measure of the film roughness. The relative roughness and the nondimensional film thickness are correlated as functions of the phasic Reynolds number ratio, R = Re/Re, i (0.15) / Re(g)(0.3). It is found that at R = 0.15, the relative roughness is a maximum. A simple model developed by matching the interfacial shear in the two fluids, predicts the wave velocity data very well.

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