Lifetime inference of skew-wiener linear degradation models  

Oleh:

Peng, Chien-Yu ; Tseng, Sheng-Tsaing

Jenis: Article from Proceeding
Dalam koleksi: International Symposium of Quality Management (ISQM) - Thinking in Quality: The Change and the Unchanged in the Economic Turmoil (Taipei, 6-7 November 2009), page 1-9.
Topik: degradation model; wiener process; skew normal; first passage time; mean-time-to-failure
Fulltext: A3-02.pdf (298.92KB)

Isi artikel

Degradation models are widely used to assess the lifetime information of highly reliable products if there exists quality characteristics whose degradation over time can be related to reliability. The performance of a degradation model depends strongly on the appropriateness of the model describing a product’s degradation path. In this paper, motivated by laser data, we propose a general linear degradation path in which the unit-to-unit variation (skew normal as a prior) of all test units can be considered simultaneously with the time-dependent structure in degradation paths. Based on the proposed degradation model, we first derive an implicit expression of a product’s lifetime distribution, including density and distribution function, and its corresponding mean-time-to-failure (MTTF). By using the EM algorithms, maximum likelihood estimation of parameters can be obtained easily. Finally, laser data is used to illustrate the proposed procedure.

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