Recursive Equations Of Word-Length Patterns For Special Geometrical Designs  

Oleh:

Tsai, Hsien-Tang ; Day, Jen-der

Jenis: Article from Proceeding
Dalam koleksi: Asian Network for Quality (ANQ) Congress 2011, Ho Chi Minh City, Vietnam, 27-30 September 2011, page 1-8.
Topik: Geometrical Design; Taguchi’s Orthogonal Array; Word-length Pattern; Minimum Aberration; Resolution
Fulltext: TW22.pdf (110.16KB)

Isi artikel

Two-level fractional factorial experiments have been used extensively in many areas such as quality engineering, agriculture, pharmaceutical chemistry, management etc., and geometrical designs proposed by Plackett & Burman (1946) are powerful tools for planning such experiments. Resolution and minimum aberration are two important criteria for choosing a good fractional factorial design, in which the word-length patterns (WLP’s) are required for comparisons. Since the saturated resolution III and saturated even resolution IV geometrical designs play important roles, recursive equations of WLP’s are developed for these two special cases to overcome heavy computation problem and to facilitate some theoretical backgrounds for further research in this area. The results also can be applied directly to the Taguchi’s orthogonal arrays since they are isomorphic to geometrical designs.

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