On-Line Chatter Detection Using Wavelet-Based Parameter Estimation  

Oleh:

Taejun, Choi ; Yung, C. Shin

Jenis: Article from Journal - ilmiah internasional
Dalam koleksi: Journal of Manufacturing Science and Engineering vol. 125 no. 1 (Feb. 2003), page 21-28.
Topik: Wavelet; on - line chatter; detection; wavelet - based; parameter estimation

Ketersediaan

Perpustakaan Pusat (Semanggi) Nomor Panggil: JJ93.4 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada

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Isi artikel

A new method for on - line chatter detection is presented. The proposed method characterizes the significant transition from high dimensional to low dimensional dynamics in the cutting process at the onset of chatter. Based on the observation that cutting signals contain fractal patterns, a wavelet - based maximum likelihood (ML) estimation algorithm is applied to on - line chatter detection. The presented chatter detection index is independent of the cutting conditions and gives excellent detection accuracy and permissible computational efficiency, which makes it suitable for on - line implementation. The validity of the proposed method is demonstrated through the tests with extensive actual data obtained from turning and milling processes.

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