3D Double-Vision Inspection Based on Structured Light  

Oleh:

Zhenzhong, Wei ; Zhang, Guangjun ; Xin, Li

Jenis: Article from Journal - ilmiah internasional
Dalam koleksi: Journal of Manufacturing Science and Engineering vol. 125 no. 3 (Aug. 2003), page 617-623.
Topik: vision; 3d; double - vision; structured light

Ketersediaan

Perpustakaan Pusat (Semanggi) Nomor Panggil: JJ93.4 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada

Lihat Detail Induk

Isi artikel

3D double-vision inspection is very necessary. It has a larger field of view, and can solve the problem of "blind area" for 3D measurement, as proposed by 3D single - vision inspection. At the beginning of this paper, the principle of structured - light based 3D vision inspection is introduced. Then, a method of gaining calibration points for 3D double - vision inspection system is proposed in detail. In order to gain calibration points with high precision, a double - directional photoelectric aiming device is designed as well, and a method for compensating the position - setting error of the aiming device is described. The coordinates of all calibration points are precisely unified in a world coordinate system. The application of RBF (radial basis function) neural network in establishing the inspection model of structured - light based 3D vision is described in detail. Finally, with the use of the calibration points, the inspection model of 3D double - vision based on RBF neural network is successfully established. The model's training accuracy is 0.078 mm, and the testing accuracy is 0.084 mm.

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