Pencitraan 2D dan 3D Optical Beam Induced Voltage Menggunakan Sensor Fotoresistor  

Oleh:

Warsito ; Suciyati, Sri Wahyu ; Harnani, Susi ; Dzakwan, Akhmad

Jenis: Article from Journal - ilmiah nasional - terakreditasi DIKTI
Dalam koleksi: Makara Journal of Technology vol. 9 no. 1 (2005), page 1-5.
Topik: OBIV; Photoresistor; Imagerie System

Ketersediaan

Perpustakaan Pusat (Semanggi) Nomor Panggil: MM64.2 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada

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Isi artikel

Study of 2D and 3D Optical Beam Induced Voltage Imaging Using Photoresistor Sensor. This article shows a method to study OBIV (optical beam induced voltage) imagerie system, that usually employ a laser scanning microscopy system. The OBIV imagerie system developed use a photoresistor sensor as a sample and simultaneously it can be used for analyzing its inhomogeneity response. Resolution of the system is still low, about 35Oum due to high value of incident light diameter. The results inform that photoresistor sensors gave an optimum response if the incident light hits the center of sensible zone.

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