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Detail
ArtikelRadiation Dose Measurement Using MOSFETs  
Oleh: Sarrabayrouse, G. ; Siskos, S.
Jenis: Article from Bulletin/Magazine
Dalam koleksi: IEEE Instrumentation & Measurement Magazine vol. 1 no. 2 (1998), page 26-34.
Topik: radiation; radiation dose; measurement; MOSFETs
Ketersediaan
  • Perpustakaan Pusat (Semanggi)
    • Nomor Panggil: II47.1
    • Non-tandon: 1 (dapat dipinjam: 0)
    • Tandon: tidak ada
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Isi artikelThe MOS transistor as a radiation dose detector has been presented. MOS transistors present advantages such as low cost, small volume and weight, robustness, accuracy, large measurable dose range, and sensitivity to low -energy radiation (10 keV). They are useful in real - time measurements or post - irradiation read - out, while they retain information after reading. The sensitivity of unbiased MOSFET s has been improved, and further improvement is possible by increasing the oxide thickness via dual dielectrics or by using ion-implanted oxides and stacked MOSFET configurations. The stacked - transistor configuration is a very promising solution to reach the mRad range (personnel dosimetry). MOSFET s are already used in various application fields with increasing interest for use in specific cases of in - vivo dosimetry.
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