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Radiation Dose Measurement Using MOSFETs
Oleh:
Sarrabayrouse, G.
;
Siskos, S.
Jenis:
Article from Bulletin/Magazine
Dalam koleksi:
IEEE Instrumentation & Measurement Magazine vol. 1 no. 2 (1998)
,
page 26-34.
Topik:
radiation
;
radiation dose
;
measurement
;
MOSFETs
Ketersediaan
Perpustakaan Pusat (Semanggi)
Nomor Panggil:
II47.1
Non-tandon:
1 (dapat dipinjam: 0)
Tandon:
tidak ada
Lihat Detail Induk
Isi artikel
The MOS transistor as a radiation dose detector has been presented. MOS transistors present advantages such as low cost, small volume and weight, robustness, accuracy, large measurable dose range, and sensitivity to low -energy radiation (10 keV). They are useful in real - time measurements or post - irradiation read - out, while they retain information after reading. The sensitivity of unbiased MOSFET s has been improved, and further improvement is possible by increasing the oxide thickness via dual dielectrics or by using ion-implanted oxides and stacked MOSFET configurations. The stacked - transistor configuration is a very promising solution to reach the mRad range (personnel dosimetry). MOSFET s are already used in various application fields with increasing interest for use in specific cases of in - vivo dosimetry.
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