Microstructure Characterization of Dislocation Wall Structure in Aluminum Using Transmission Electron Microscopy  

Oleh:

Gan, J. ; Vetrano, J. S. ; Khaleel, M. A.

Jenis: Article from Bulletin/Magazine
Dalam koleksi: Journal of Engineering Materials and Technology vol. 124 no. 3 (2002), page 297-301.
Topik: microscopy; microstructure; dislocation; transmission; electron microscopy

Ketersediaan

Perpustakaan Pusat (Semanggi) Nomor Panggil: JJ87.3 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada

Lihat Detail Induk

Isi artikel

The configuration of dislocation wall structures and the interactions between dislocations and dislocation walls play a significant role in the understanding of deformation processes in metals. Samples of single - crystal aluminum deformed by tensile - straining (15 %) were analyzed using TEM. In tensile - deformed (15 %) single crystal aluminum, a cell structure is well developed and dislocations in the cell boundaries consist of either one set of Burgers vector or two sets of Burgers vector. The three - dimensional image of cell wall structure, misorientation angle across the cell boundaries and the Burgers vectors of dislocations in the cell boundaries are characterized.

Opini Anda

Klik untuk menuliskan opini Anda tentang koleksi ini!

Kembali