Detail Built-In-Test in Support System Maintenance   Oleh:  Drees, R. ; Young, N. Jenis: Article from Bulletin/Magazine Dalam koleksi: IEEE Instrumentation & Measurement Magazine vol. 5 no. 3 (2002), page 25-29. Topik: support; built - in - test; support system; maintenance Ketersediaan Perpustakaan Pusat (Semanggi) Nomor Panggil: II47.3 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada     Lihat Detail Induk Isi artikel This article looks at the state of BIT (built - in - test) in test and measurement instruments, explains BIT's effect on system readiness, and presents ideas on how to improve BIT technologies and standards. The following topics are discussed : circuit level BIT (built - in self - test) ; module level and line replaceable units (LRU) ; system - level self - contained testing ; instrumentation BIT history ; BIT fault coverage and isolation in support system maintenance ; BIT development process ; pitfalls and limitations of BIT ; BIT effectiveness in support system maintenance and availability. Opini Anda Klik untuk menuliskan opini Anda tentang koleksi ini! Kembali

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