Integrated Dynamic and Static PAT Method Applied in the Semiconductor Packaging and Testing Industry  

Oleh:

Hsiao, Edy ; Chang, Ko Wei ; Chang, Charles

Jenis: Article from Proceeding
Dalam koleksi: 12th ANQ Congress in Singapore, 5-8 Agustus 2014, page 1-10.
Topik: Statistical process control (SPC); Part average testing (PAT); Dynamic PAT; Static PAT; Failure Analysis
Fulltext: PM2-1.3-P0313.pdf (391.31KB)

Isi artikel

Facing global competitiveness and economics recession, the quality and requirements on products will be gradually emphasized. However, innovative design and advanced technology for improving the performance of business have been the primary and necessary element. With the development of control charts, statistical process control (SPC) has been a successful and effective technique applied in the progression of manufacturing industries. SPC is widely used and applied in practice, but the disadvantage is that the procedure is easily affected by extreme values with inappropriate sampling methods or unrepresentative observations. Moreover, huge amount of data and time will be consumed. The integrated PAT control chart similar to the typical control chart is suitable to be used for monitoring the behavior and trend of the batch production. The part average testing (PAT) is a statistical and data-based tool for removing abnormal observations (outliers) with process exception. The specific limits with the PAT procedure are established and monitoring the electrical characteristics for packaged dice by using integrated static and dynamic approaches. The control limits of PAT procedure shall not exceed the device specification limits. The dynamic PAT can mainly provide tighter limits without causing rejection of good parts without considering the lot-to-lot variation. The static PAT primarily detects lot-to-lot variation with collecting test data from at least six part lots that have passed the defined device specification. The integrated PAT with static and dynamic methods combined with failure analysis of reliability testing would be such a beneficial technique to gain more practical insights and provide rapid feedback preventing quality accidents. Eventually, the proposed method is applied to the illustrated examples for the verification purpose

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