Development of Seebeck-Coefficient Measurement Systems Using Kelvin-Probe Force Microscopy  

Oleh:

Miwa, Kazutoshi ; Salleh, Faiz

Jenis: Article from Journal - ilmiah nasional - terakreditasi DIKTI
Dalam koleksi: Makara Journal of Technology vol. 17 no. 1 (Apr. 2013), page 17-20.
Topik: Fermi Energy; Kelvin-Probe Force Microscopy; Seebeck Coefficient
Fulltext: 256-286-1-PB.pdf (168.78KB)

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Perpustakaan Pusat (Semanggi) Nomor Panggil: MM64 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada

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Isi artikel

Thermoelectric device is investigated by a number of researchers in order to enhance the thermoelectric efficiency. It is known that the efficiency can be improved by quantum effect. However, it is difficult to measure the thermoelectric characteristics of nanometer-scale structures. Thus a new measurement method is expected to be developed. We propose to apply Kelvin-probe force microscopy (KFM) to characterization of thermoelectric materials. KFM can locally observe surface potential of Fermi energy of a sample without touching the sample surface. In the present paper, we estimate the Seebeck coefficient of thin Si-on-insulator layers using KFM.

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