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A System for The Dynamic Characterization of Microstructures
Oleh:
Glennie, D.
;
Burdess, J. S.
;
Wood, D.
;
Pitcher, R. J.
;
Harris, A. J.
Jenis:
Article from Bulletin/Magazine
Dalam koleksi:
Journal of Microelectro Mechanical System vol. 6 no. 4 (1997)
,
page 322-328.
Topik:
Characterization
;
system
;
dynamic characterization
;
microstructures
Ketersediaan
Perpustakaan Pusat (Semanggi)
Nomor Panggil:
JJ30.2
Non-tandon:
1 (dapat dipinjam: 0)
Tandon:
tidak ada
Lihat Detail Induk
Isi artikel
This paper describes a fully automated measurement system designed to evaluate the dynamic characteristics of micromechanical structures (millimeter dimensions). To validate the system, vibration measurements have been carried on two structures - a micromachined silicon cantilever and bridge - and the results are presented. Out - of - plane measurements show that for the cantilever, both the mode shapes and resonant frequencies agree with beam theory predictions. However, for the bridge structure, tension due to boron doping causes a change from beam - like behaviour and a more complex model is required. Mode - shapes natural frequencies and modal damping are determined from data obtained by vibrating the structures using a piezoelectric mounting system and deriving the transfer function between the piezodrive voltage and beam vibrational velocity.
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