Detail Networking Automatic Test Equipment Environments   Oleh:  Benetazzo, L. ; Bertocco, M. ; Narduzzi, C. Jenis: Article from Bulletin/Magazine Dalam koleksi: IEEE Instrumentation & Measurement Magazine vol. 8 no. 1 (Mar. 2005), page 16-21. Topik: ENVIRONMENT; networking automatic; test equipment; environments Ketersediaan Perpustakaan Pusat (Semanggi) Nomor Panggil: II47 Non-tandon: 1 (dapat dipinjam: 0) Tandon: tidak ada     Lihat Detail Induk Isi artikel Automatic test equipment (ATE) is a term that, in its broadest meaning, indicates a generic system capable of performing measurements in an automatic or semiautomated (human - assisted) way. Years ago, this term was used specifically to refer to an automated measurement system employed to test the functionality of some electronic device - under - test (DUT). Typical applications were in the manufacturing area, where ATE had a twofold nature : in - circuit testing and functional testing. For in - circuit testing, ATE often were stand-alone complex programmable machines, equipped with a bed - of - nails adapter specifically designed as a fixture to provide signal inputs and meaningful test-points of the DUT. The test engineer had the responsibility of writing code that determined the exact sequence of stimulus signals, response measurements, and go / no - go decisions. For this aim, a switch matrix and the ATE itself were suitably controlled and coordinated by a workstation. For functional testing, ATE consisted of off - the - shelf instruments connected to the DUT by some kind of front - end adapter. In the latter case, most of the effort of the test engineer consisted of designing a program to control the various instruments to assess DUT performances. When planning the use of a dedicated testing machine as opposed to a test bench, other factors were taken into account : measurement speed, cost, and fault coverage. Opini Anda Klik untuk menuliskan opini Anda tentang koleksi ini! Kembali

Copyright © 2006, 2007 Unika Atma Jaya, all rights reserved