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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
Oleh:
Muller, D.A.
;
Kourkoutis, L. Fitting
;
Murfitt, M.
;
Song, J.H.
;
Hwang, H.Y.
;
Silcox, J.
;
Dellby, N.
;
Krivanek, O.L.
Jenis:
Article from Bulletin/Magazine
Dalam koleksi:
SCIENCE (keterangan: ada di Proquest) vol. 319 no. 5866 (Feb. 2008)
,
page 1073.
Ketersediaan
Perpustakaan FK
Nomor Panggil:
S01.K.2008.02
Non-tandon:
1 (dapat dipinjam: 0)
Tandon:
tidak ada
Lihat Detail Induk
Isi artikel
Using a fifth-order aberration-corrected scanning transmission electron microscope, which provides a factor of 100 increase in signal over an uncorrected instrument, we demonstrated two-dimensional elemental and valence-sensitive imaging at atomic resolution by means of electron energy-loss spectroscopy, with acquisition times of well under a minute (for a 4096-pixel image). Applying this method to the study of a La0.7Sr0.3MnO3/SrTiO3 multilayer, we found an asymmetry between the chemical intermixing on the manganese-titanium and lanthanum-strontium sublattices. The measured changes in the titanium bonding as the local environment changed allowed us to distinguish chemical interdiffusion from imaging artifacts.
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