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Detail
JurnalIEEE Instrumentation & Measurement Magazine vol. 4 no. 3 (2001)
Bibliografi
Topik: INSTRUMENTATION; TECHNOLOGY; MEASUREMEN MAGAZINE
Bahasa: (EN )    ISSN: 1094-6969    Year:: 2001    
Penerbit: IEEE
Jenis: Bulletin/Magazine
[Lihat daftar eksemplar jurnal IEEE Instrumentation & Measurement Magazine]
Ketersediaan
  • Perpustakaan Pusat (Semanggi)
    • Nomor Panggil: II47.2
    • Non-tandon: 1 (dapat dipinjam: 0)
    • Tandon: tidak ada
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Artikel dalam koleksi ini
  1. Molecular Nanotechnology, halaman 11-20
  2. Microtechnology and Microsystems in Measurement Applications, halaman 21-23
  3. Opportunities for Microtechnology in Metrology, halaman 24-29
  4. Packaging of Microsystems for Harsh Environments, halaman 30-33
  5. Integrated Silicon Microspectrometers, halaman 34-40
  6. Java as A Teaching Tool, halaman 42-46
  7. Measuring Radiation, halaman 47-48
  8. Gyroscopes, halaman 49-58
  9. Giving Meaning to Measurement, halaman 41

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